Archie, C. Metrology, Inspection, and Process Control for Microlithography XXI. SPIE Digital Library.
Citación estilo ChicagoArchie, Charles. Metrology, Inspection, and Process Control for Microlithography XXI. SPIE Digital Library.
Cita MLAArchie, Charles. Metrology, Inspection, and Process Control for Microlithography XXI. SPIE Digital Library.
Warning: These citations may not always be 100% accurate.