APA (7. basım) Alıntı

Duparré, A. Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies III. SPIE Digital Library.

Chicago Style (17. basım) Atıf

Duparré, Angela. Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies III. SPIE Digital Library.

MLA (9th ed.) Atıf

Duparré, Angela. Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies III. SPIE Digital Library.

Uyarı: Bu alıntı herzaman %100 doğru olmayabilir..