Hartzell, A. Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS VII. SPIE Digital Library.
Chicago Style (17th ed.) ZitazioaHartzell, Allyson. Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS VII. SPIE Digital Library.
MLA (9th ed.) ZitazioaHartzell, Allyson. Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS VII. SPIE Digital Library.
Kontuz: berrikusi erreferentzia hauek erabili aurretik.