Hartzell, A. Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS VII. SPIE Digital Library.
Cita Chicago Style (17a ed.)Hartzell, Allyson. Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS VII. SPIE Digital Library.
Cita MLA (9a ed.)Hartzell, Allyson. Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS VII. SPIE Digital Library.
Precaución: Estas citas no son 100% exactas.