Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS VII

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Ētahi atu kaituhi: Hartzell, Allyson
Hōputu: Tāhiko īPukapuka
Reo:Ingarihi
I whakaputaina: SPIE Digital Library, 2/19/08
Ngā marau:
Urunga tuihono:Full text available on Research4Life (SPIE Digital Library)
Whakaahuatanga
Whakaahutanga tūemi:<strong>On-Campus Access Only (IP based access)</strong>
Whakaahuatanga ōkiko:1 online resource
Hōputu:Mode of access: Internet
ISBN:9780819470591
Urunga:Electronic access restricted to authorized AUW faculty, staff and students