Allgair, J. Metrology, Inspection, and Process Control for Microlithography XXII. SPIE Digital Library.
Chicago Style (17th ed.) CitationAllgair, John. Metrology, Inspection, and Process Control for Microlithography XXII. SPIE Digital Library.
MLA citiranjeAllgair, John. Metrology, Inspection, and Process Control for Microlithography XXII. SPIE Digital Library.
Opozorilo: Ti citati niso vedno 100% točni.