APA (7e ed.) Bronvermelding

Kullberg, R. Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices VIII. SPIE Digital Library.

Chicago (17e ed.) Bronvermelding

Kullberg, Richard. Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices VIII. SPIE Digital Library.

MLA (9e ed.) Bronvermelding

Kullberg, Richard. Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices VIII. SPIE Digital Library.

Let op: Deze citaties zijn niet altijd 100% accuraat.