APA (7th ed.) Zitazioa

Kullberg, R. Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices VIII. SPIE Digital Library.

Chicago Style (17th ed.) Zitazioa

Kullberg, Richard. Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices VIII. SPIE Digital Library.

MLA (9th ed.) Zitazioa

Kullberg, Richard. Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices VIII. SPIE Digital Library.

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