Style de citation APA (7e éd.)

Kullberg, R. Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices VIII. SPIE Digital Library.

Style de citation Chicago (17e éd.)

Kullberg, Richard. Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices VIII. SPIE Digital Library.

Style de citation MLA (9e éd.)

Kullberg, Richard. Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices VIII. SPIE Digital Library.

Attention : ces citations peuvent ne pas être correctes à 100%.