APA (7. basım) Alıntı

Kullberg, R. Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices VIII. SPIE Digital Library.

Chicago Style (17. basım) Atıf

Kullberg, Richard. Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices VIII. SPIE Digital Library.

MLA (9th ed.) Atıf

Kullberg, Richard. Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices VIII. SPIE Digital Library.

Uyarı: Bu alıntı herzaman %100 doğru olmayabilir..