Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices VIII

Bibliografiske detaljer
Andre forfattere: Kullberg, Richard
Format: Electronisk eBog
Sprog:engelsk
Udgivet: SPIE Digital Library, 2/6/09
Fag:
Online adgang:Full text available on Research4Life (SPIE Digital Library)

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