APA(7版)引用形式

Kullberg, R. Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices IX. SPIE Digital Library.

Chicagoスタイル(17版)引用形式

Kullberg, Richard. Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices IX. SPIE Digital Library.

MLA(9版)引用形式

Kullberg, Richard. Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices IX. SPIE Digital Library.

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