Kullberg, R. Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices IX. SPIE Digital Library.
Lua i Stíl Chicago (17ú heag.)Kullberg, Richard. Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices IX. SPIE Digital Library.
Lua MLA (9ú heag.)Kullberg, Richard. Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices IX. SPIE Digital Library.
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