Cita APA

Raymond, C. Metrology, Inspection, and Process Control for Microlithography XXIV. SPIE Digital Library.

Citación estilo Chicago

Raymond, Christopher. Metrology, Inspection, and Process Control for Microlithography XXIV. SPIE Digital Library.

Cita MLA

Raymond, Christopher. Metrology, Inspection, and Process Control for Microlithography XXIV. SPIE Digital Library.

Warning: These citations may not always be 100% accurate.