8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Subnanometer Accuracy Measurement for Synchrotron Optics and X-Ray Optics

Manylion Llyfryddiaeth
Awduron Eraill: Qian, Shinan
Fformat: Electronig eLyfr
Iaith:Saesneg
Cyhoeddwyd: SPIE Digital Library, 1/1/16
Pynciau:
Mynediad Ar-lein:Full text available on Research4Life (SPIE Digital Library)

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