8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Subnanometer Accuracy Measurement for Synchrotron Optics and X-Ray Optics

Bibliografski detalji
Daljnji autori: Qian, Shinan
Format: Elektronički e-knjiga
Jezik:engleski
Izdano: SPIE Digital Library, 1/1/16
Teme:
Online pristup:Full text available on Research4Life (SPIE Digital Library)

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