Okładka

Automated Visual Inspection and Machine Vision V

Opis bibliograficzny
Kolejni autorzy:	Beyerer, JÃ¼rgen, Fraunhofer-Institut fÃ¼r Optronik, Systemtechnik und Bildauswertung IOSB
Format:	Elektroniczne E-book
Język:	angielski
Wydane:	SPIE Digital Library, 1/1/69
Hasła przedmiotowe:	Conference papers and proceedings.
Dostęp online:	Full text available on Research4Life (SPIE Digital Library)

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