Advances in Computational Methods for X-Ray Optics VI

Advances in Computational Methods for X-Ray Optics V

X-Ray Nanoimaging: Instruments and Methods VI

Advances in X-Ray/EUV Optics and Components VI

Advances in Metrology for X-Ray and EUV Optics VI

Advances in X-Ray Optics

Optics for EUV, X-Ray, and Gamma-Ray Astronomy VI

Advances in Laboratory-based X-Ray Sources, Optics, and Applications VI

Advances in X-Ray/EUV Optics and Components X

Advances in Metrology for X-Ray and EUV Optics X

Developments in X-Ray Tomography VI

Damage to VUV, EUV, and X-ray Optics VI

X-Ray Nanoimaging: Instruments and Methods

Advances in Metrology for X-Ray and EUV Optics

Multilayer Optics for Advanced X-Ray Applications

Hard X-Ray and Gamma-Ray Detector Physics VI

EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy VI

Photomask and X-Ray Mask Technology VI

Soft X-Ray Lasers and Applications VI

Optics for EUV, X-Ray, and Gamma-Ray Astronomy X

X-Ray Nanoimaging: Instruments and Methods II

X-Ray Nanoimaging: Instruments and Methods V

X-Ray Nanoimaging: Instruments and Methods IV

X-Ray Nanoimaging: Instruments and Methods III

Advances in X-ray Free-Electron Lasers: Radiation Schemes, X-ray Optics, and Instrumentation

X-Ray Sources and Optics

Soft X-Ray Optics
por: Spiller, Eberhard Adolf

Adaptive X-Ray Optics

Advances in X-Ray/EUV Optics and Components XVII

Advances in X-Ray/EUV Optics and Components XVIII

Advances in Metrology for X-Ray and EUV Optics V

Advances in X-Ray/EUV Optics and Components IX

Advances in X-Ray/EUV Optics and Components XVI

Advances in X-Ray/EUV Optics and Components XIV

Advances in Metrology for X-Ray and EUV Optics VIII

Advances in Metrology for X-Ray and EUV Optics VII

Advances in X-Ray/EUV Optics and Components XII