Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology

Bibliografske podrobnosti
Glavni avtor: Shahriar, Selim M.
Format: Elektronski eKnjiga
Jezik:angleščina
Izdano: SPIE Digital Library, 1/1/19
Teme:
Online dostop:Full text available on Research4Life (SPIE Digital Library)
Opis
Opis knjige/članka:<strong>On-Campus Access Only (IP based access)</strong>
Fizični opis:1 online resource
Format:Mode of access: Internet
ISBN:9781510625112
Dostop:Electronic access restricted to authorized AUW faculty, staff and students