Standards for Electronics Imaging Technologies, Devices, and Systems: A Critical Review

Bibliografski detalji
Daljnji autori: Nier, Michael
Format: Elektronički e-knjiga
Jezik:engleski
Izdano: SPIE Digital Library, 1/1/96
Teme:
Online pristup:Full text available on Research4Life (SPIE Digital Library)

Slični predmeti