Precision Surface Metrology
| Rannpháirtithe: | Wyant, James |
|---|---|
| Formáid: | Leictreonach Ríomhleabhar |
| Teanga: | Béarla |
| Foilsithe / Cruthaithe: |
SPIE Digital Library,
11/15/83
|
| Ábhair: | |
| Rochtain ar líne: | Full text available on Research4Life (SPIE Digital Library) |
Míreanna comhchosúla
Surface Topography: Metrology and Properties
Optical and Quantum Sensing and Precision Metrology
In-Process Optical Metrology for Precision Machining
Surface Scattering and Diffraction for Advanced Metrology
Laser Metrology for Precision Measurement and Inspection in Industry
Surface Scattering and Diffraction for Advanced Metrology II
Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology
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Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology II
Slow Light, Fast Light, and Opto-Atomic Precision Metrology VIII
Slow Light, Fast Light, and Opto-Atomic Precision Metrology IX
Slow Light, Fast Light, and Opto-Atomic Precision Metrology X
Surfacing.
de réir: Atwood, Margaret
Foilsithe / Cruthaithe: (1972)
de réir: Atwood, Margaret
Foilsithe / Cruthaithe: (1972)
Surfacing.
de réir: Atwood, Margaret
Foilsithe / Cruthaithe: (1972)
de réir: Atwood, Margaret
Foilsithe / Cruthaithe: (1972)
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Precision Medicine Oncology
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de réir: Sturma
Writing Surfaces
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de réir: derekbeaulieu