APA (7th ed.) Citation

García-Blanco, S. Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices X. SPIE Digital Library.

Chicago Style (17th ed.) Citation

García-Blanco, Sonia. Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices X. SPIE Digital Library.

MLA (9th ed.) Citation

García-Blanco, Sonia. Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices X. SPIE Digital Library.

Warning: These citations may not always be 100% accurate.