GarcÃa-Blanco, S. Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices X. SPIE Digital Library.
Цитирование в стиле Чикаго (17-е изд.)GarcÃa-Blanco, Sonia. Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices X. SPIE Digital Library.
Цитирование MLA (9-е изд.)GarcÃa-Blanco, Sonia. Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices X. SPIE Digital Library.
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