Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices X

Bibliografiske detaljer
Andre forfattere: García-Blanco, Sonia
Format: Electronisk eBog
Sprog:engelsk
Udgivet: SPIE Digital Library, 2/11/11
Fag:
Online adgang:Full text available on Research4Life (SPIE Digital Library)

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