Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices X

Bibliografski detalji
Daljnji autori: García-Blanco, Sonia
Format: Elektronički e-knjiga
Jezik:engleski
Izdano: SPIE Digital Library, 2/11/11
Teme:
Online pristup:Full text available on Research4Life (SPIE Digital Library)

Slični predmeti