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MEMS Reliability for Critical Applications

Detalhes bibliográficos
Outros Autores:	Lawton, Russell
Formato:	Recurso Eletrônico livro eletrônico
Idioma:	inglês
Publicado em:	SPIE Digital Library, 8/10/00
Assuntos:	Conference papers and proceedings.
Acesso em linha:	Full text available on Research4Life (SPIE Digital Library)

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