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Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices VIII

Détails bibliographiques
Autres auteurs:	Kullberg, Richard
Format:	Électronique eBook
Langue:	anglais
Publié:	SPIE Digital Library, 2/6/09
Sujets:	Conference papers and proceedings.
Accès en ligne:	Full text available on Research4Life (SPIE Digital Library)

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