Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices IX

Bibliographic Details
Other Authors: Kullberg, Richard
Format: Electronic eBook
Language:English
Published: SPIE Digital Library, 2/4/10
Subjects:
Online Access:Full text available on Research4Life (SPIE Digital Library)
Description
Item Description:<strong>On-Campus Access Only (IP based access)</strong>
Physical Description:1 online resource
Format:Mode of access: Internet
ISBN:9780819479884
Access:Electronic access restricted to authorized AUW faculty, staff and students