Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices X
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| 格式: | 电子 电子书 |
| 语言: | 英语 |
| 出版: |
SPIE Digital Library,
2/11/11
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| 主题: | |
| 在线阅读: | Full text available on Research4Life (SPIE Digital Library) |
| Item Description: | <strong>On-Campus Access Only (IP based access)</strong> |
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| 实物描述: | 1 online resource |
| 格式: | Mode of access: Internet |
| ISBN: | 9780819484659 |
| 访问: | Electronic access restricted to authorized AUW faculty, staff and students |