Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices X

Manylion Llyfryddiaeth
Awduron Eraill: García-Blanco, Sonia
Fformat: Electronig eLyfr
Iaith:Saesneg
Cyhoeddwyd: SPIE Digital Library, 2/11/11
Pynciau:
Mynediad Ar-lein:Full text available on Research4Life (SPIE Digital Library)

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