Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices X

Bibliográfalaš dieđut
Eará dahkkit: García-Blanco, Sonia
Materiálatiipa: Elektrovnnalaš E-girji
Giella:eaŋgalasgiella
Almmustuhtton: SPIE Digital Library, 2/11/11
Fáttát:
Liŋkkat:Full text available on Research4Life (SPIE Digital Library)

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